The IEEE International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR) aims to bring together design, reliability and test engineers and researchers to discuss the impact of advanced low-power low-voltage design methodologies of nanometer silicon systems on test and reliability. Power and thermal issues, leakage, process variations, susceptibility to envi- ronmental and operation-induced interference drive the development of low-power, process-tolerant design techniques and generate a new set of test and reliability challenges, questing for an innovative set of methodologies and tools

Topics of Interest

The topics include, but not restricted to the following list:

Energy-reliability tradeoff (inc. controlled losses) and its integration with power management
Power and Thermal Issues in 3D ICs
Challenges of Ultra Lowpower design on test and reliability
Emerging failure modes
Test of SoC with power and thermal management
Energy, power and process variations aware design and test
Test and reliability implications of leakage
Low-power/voltage DfT, Dynamic BIST, Scan and ATPG
Delay, statistical and parametric testing for LP circuits
Signal integrity under test
Test and reliability of LP redundant systems
Analog, mixed-signal and asynchronous low-power design, test and DfT
EDA tools to support process-tolerant LP design

Attraction of LPonTR

This workshop invites the authors to submit their work-in-progress in a form of a 2-page extended abstract. All submissions are reviewed by experts from industry and academia. The accepted papers are published in the workshop proceedings and their authors are invited to present their work as a talk, poster and/or a demonstration.

The workshop encourages feedback to the authors and networking. Selected submissions are invited for publication as full papers in the Journal of Low Power Electronics (JOLPE).

For companies, this workshop gives an opportunity to expose themselves by giving a talk, participating in the panel discussion and/or demonstrating their tools/products in a dedicated session. Please see the past technical programme for more details.

Please visit the links below and download the proceedings of LPonTR 2008–2012. The technical programmes of the past events show how densely the workshop days are packed and indicate the overall value of the event.

LPonTR shares accommodation, catering and lunch facilities with the main ETS, which is known for its high standards. All communication including submission of manuscripts is normally done by email. The workshop chairs will be happy to answer all queries.

On-line Proceedings, Call for Papers and other documents

LPonTR’2012
LPonTR’2011
LPonTR’2010
LPonTR’2009
LPonTR’2008

Chairs of LPonTR

Alex Bystrov(2008-2012), Newcastle University, Newcastle upon Tyne, U.K

Patrick Girard(2009-2012) LIRMM, Montpellier, France

Joao Paulo Cacho Teixeira(2008), IST, Technical Univ. Lisbon (TUL), INESC-ID Lisboa, Portugal

Technical Programme Committee

Bashir Al-Hashimi, Univ. of Southampton, UK
Karim Arabi, Qualcomm, USA
Swarup Bhunia, Case Western Reserve Univ., USA
Krish Chakrabarty, Duke Univ., USA
Krishna Chakravadhanula, Cadence, USA
Luigi Dilillo, LIRMM, France
Peter Harrod, ARM Ltd, UK
Mokhtar Hirech, Synopsys, USA
Gert Jervan, Tallinn Univ., Estonia
Niraj Jha, Princeton University, USA
Mark Kassab, Mentor Graphics, USA
Sandip Kundu, Univ. Massachusetts, USA
Erik Larsson, Lund Univ., Sweden
T.M. Mak, Intel, USA
Hans Manhaeve, Q-Star, Belgium
Nicola Nicolici, McMaster Univ., Canada
Ilia Polian, Univ. of Passau, Germany
Irith Pomeranz, Purdue Univ., USA
Srivaths Ravi, TI, India
Sudhakar Reddy, Univ. of Iowa, USA
Juan Jose Rodriguez Andina, Univ. Vigo, Spain
Ozgur Sinanoglu, Univ. NYUAD, Abu Dhabi
Virendra Singh, Indian Institute of Science, India
Mohammad Tehranipoor, Univ. Connecticut, US
J. Paulo Teixeira, INESC-ID, Portugal
Nur Touba, Univ. of Texas at Austin, USA
Seongmoon Wang, NEC, USA
Xiaoqing Wen, Kyushu Inst. of Technology, Japan
Hans-Joachim Wunderlich, Univ. of Stuttgart, Germany
Qiang Xu, The Chinese University of Hong Kong

LPonTR community

Bashir Al-Hashimi, University of Southampton, UK
David Atienza, Univ. of Madrid – Spain, EPFL – Switzerland
Bernd Becker, Department of Computer Science University of Freiburg, Germany
Paolo Bernardi, Politecnico di Torino, Italy
Davide Bertozzi, Univ. of Ferrara, Italy
Tobias Bjerregaard, Teklatech, Denmark
Alberto Bosio, LIRMM – University of Montpellier, France
Samir Boubezari, Atheros, Canada
Alexander Bystrov, Newcastle University, UK
Nick Cowern, Newcastle University, UK
Giorgio Di Natale, LIRMM, France
Luigi Dilillo, LIRMM / Univ. Montpellier
James Docherty, Newcastle University, UK
Stephan Eggersgluss, University of Bremen, Germany
Santiago Fernandez-Gomez, Physical Design Manager, Apple Inc., USA
Joan Figueras, University Barcelona, Spain
Judit Freijedo, Universidad de Vigo – Departamento de Tecnologia Electronica, Spain
Patrick Girard, LIRMM, Montpellier, France
Elena Hammari, Norwegian University of Science and Technology, Norway
Peter Harrod, ARM Ltd, UK
Domenik Helms, OFFIS, Germany
Richard Illman, Cadence, UK
Michael Imhof, Institut fuer Technische Informatik Universitaet Stuttgart, Germany
Michiko Inoue, Nara Institute of Science and Technology, Japan
Gert Jervan, Tallinn University of Technology, Estonia
Srinivas Katkoori, Department of Computer Science and Engineering, University of South Florida, Tampa
Miyase Kohei, Kyushu Institute of Technology, Japan
Rene Kothe, Brandenburg University of Technology Cottbus, Germany
Sandip Kundu, University of Massachusetts, USA
Wieslaw Kuzmicz, University of Warsaw
Enrico Macii, Politecnico di Torino, Italy
Grzegorz Mrugalski, Mentor Graphics Corp.
Philipp Nenninger, ABB Corporate Research Centre, Germany
Nicola Nicolici, McMaster University, Canada
Michael O’Sullivan, Cadence, UK
Satoshi Ohtake, Nara Institute of Science and Technology, Japan
Ilia Polian, Univ. of Passau, Germany
Irith Pomeranz, Purdue University, USA
Janusz Rajski, Mentor Graphics Corporation, Poland
Sudhakar Reddy, University of Iowa, USA
Teresa Riesgo, Polytechnic University of Madrid, Spain
Juan José Rodríguez-Andina, University of Vigo, Spain
William Ruby, Sequence Design, Inc.
Gordon Russell, Newcastle University, UK
Sudip Roy, Department of Computer Science & Engineering, Indian Institute of Technology Kharagpur, India
Scott Roy, University of Glasgow, UK
Kewal Saluja, University of Wisconsin - Madison, USA
Michihiro Shintani, Semiconductor Technology Academic Research Center, Japan
Joao Paulo Teixeira, IST / TUL INESC-ID, Portugal
Daniel Tille, University of Bremen, Germany
Aida Todri, LIRMM / Univ. Montpellier
Fabian Vargas, PUCRS, Brasil
Xiaoqing Wen, Kyushu Institute of Technology, Japan
T.W. Williams, Synopsys Inc., USA
Mark Zwolinski, University of Southampton, UK

(Please let me know of any inaccuracies in this page A.Bystrov)

Revision: 1st May 2012

IEEE International Workshop on Impact of Low-Power design on Test and Reliability – LPonTR

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